发明名称 |
SINGLE ELECTRON TRANSISTOR HAVING CONSTRICTION BARRIER AND FABRICATION METHOD OF THE SAME |
摘要 |
<p>A single electron transistor including a constriction barrier and a manufacturing method thereof are provided to implement a tunneling barrier by forming a constriction barrier in an active region in both sides of a control gate. A channel region(12a) is defined as the predetermined micro pattern in a silicon layer(10) of an SOI substrate. A source region(24) and a drain region(26) are separated with a predetermined distance while interposing a channel region. A gate insulating layer is formed in the upper part of the channel region. The gate is formed in the upper part of the gate insulating layer. A channel constriction oxide layer(72) is self-aligned in both sides of the gate. The channel constriction oxide layer encroaches on the channel region.</p> |
申请公布号 |
KR20090058970(A) |
申请公布日期 |
2009.06.10 |
申请号 |
KR20070125789 |
申请日期 |
2007.12.05 |
申请人 |
SEOUL NATIONAL UNIVERSITY INDUSTRY FOUNDATION |
发明人 |
PARK, BYUNG GOOK;LEE, DONG SEUP |
分类号 |
H01L29/775;H01L29/78 |
主分类号 |
H01L29/775 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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