发明名称 SINGLE ELECTRON TRANSISTOR HAVING CONSTRICTION BARRIER AND FABRICATION METHOD OF THE SAME
摘要 <p>A single electron transistor including a constriction barrier and a manufacturing method thereof are provided to implement a tunneling barrier by forming a constriction barrier in an active region in both sides of a control gate. A channel region(12a) is defined as the predetermined micro pattern in a silicon layer(10) of an SOI substrate. A source region(24) and a drain region(26) are separated with a predetermined distance while interposing a channel region. A gate insulating layer is formed in the upper part of the channel region. The gate is formed in the upper part of the gate insulating layer. A channel constriction oxide layer(72) is self-aligned in both sides of the gate. The channel constriction oxide layer encroaches on the channel region.</p>
申请公布号 KR20090058970(A) 申请公布日期 2009.06.10
申请号 KR20070125789 申请日期 2007.12.05
申请人 SEOUL NATIONAL UNIVERSITY INDUSTRY FOUNDATION 发明人 PARK, BYUNG GOOK;LEE, DONG SEUP
分类号 H01L29/775;H01L29/78 主分类号 H01L29/775
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