Contacting unit for use in integrated circuit testing device, has contact springs provided with separate springily contact spring parts, which exhibit contact region of contact area, where springs are arranged in opening

摘要

The unit (1) has contact springs (7a, 7b) exhibiting a contact area, and formed and/or supported springily such that the contact area of the contact springs is pressed against a connection contact (5) of an electronic component (3) i.e. integrated circuit, in a test position of the component relative to the unit. The contact springs are provided with multiple separate springily contact spring parts, which exhibit a partial contact region of the contact area, where the contact springs are arranged in an opening (15) within the unit. Independent claims are also included for the following: (1) a testing device for testing electronic components, comprising a carrier (2) a method for contacting connection contacts of electronic components with a contacting unit.