发明名称 Bidirectional split gate NAND flash memory structure and array, method of programming, erasing and reading thereof, and method of manufacturing
摘要 A split gate NAND flash memory structure is formed on a semiconductor substrate of a first conductivity type. The NAND structure comprises a first region of a second conductivity type and a second region of the second conductivity type in the substrate, spaced apart from the first region, thereby defining a channel region therebetween. A plurality of floating gates are spaced apart from one another and each is insulated from the channel region. A plurality of control gates are spaced apart from one another, with each control gate insulated from the channel region. Each of the control gate is between a pair of floating gates and is capacitively coupled to the pair of floating gates. A plurality of select gates are spaced apart from one another, with each select gate insulated from the channel region. Each select gate is between a pair of floating gates.
申请公布号 US7544569(B2) 申请公布日期 2009.06.09
申请号 US20060516431 申请日期 2006.09.05
申请人 SILICON STORAGE TECHNOLOGY, INC. 发明人 GAO FENG;LIN YA-FEN;COOKSEY JOHN W.;CHEN CHANGYUAN;WIDJAJA YUNIARTO;LEE DANA
分类号 H01L21/336 主分类号 H01L21/336
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