发明名称 Method and apparatus for measurement of crossfield chromatic response of projection imaging systems
摘要 A method and apparatus for measuring the chromatic response of lithographic projection imaging systems is described. An apparatus for determining the lens aberrations for a lithographic projection lens is provided. A substrate coated with a suitable recording media is provided. A series of lithographic exposures are performed using an exposure source with variable spectral settings. The exposures are measured, and the measurements are used to determine a chromatic response of the projection imaging system.
申请公布号 US7544449(B1) 申请公布日期 2009.06.09
申请号 US20050280531 申请日期 2005.11.14
申请人 LITEL INSTRUMENTS 发明人 SMITH ADLAI H.;HUNTER, JR. ROBERT O.;BENDIK JOSEPH
分类号 G03C5/00;G03F9/00 主分类号 G03C5/00
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