发明名称 |
Method and apparatus for measurement of crossfield chromatic response of projection imaging systems |
摘要 |
A method and apparatus for measuring the chromatic response of lithographic projection imaging systems is described. An apparatus for determining the lens aberrations for a lithographic projection lens is provided. A substrate coated with a suitable recording media is provided. A series of lithographic exposures are performed using an exposure source with variable spectral settings. The exposures are measured, and the measurements are used to determine a chromatic response of the projection imaging system.
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申请公布号 |
US7544449(B1) |
申请公布日期 |
2009.06.09 |
申请号 |
US20050280531 |
申请日期 |
2005.11.14 |
申请人 |
LITEL INSTRUMENTS |
发明人 |
SMITH ADLAI H.;HUNTER, JR. ROBERT O.;BENDIK JOSEPH |
分类号 |
G03C5/00;G03F9/00 |
主分类号 |
G03C5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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