发明名称 Circuit and method of driving sub-word lines of a semiconductor memory device
摘要 A circuit and method of driving a sub-word line of a semiconductor memory device capable of reducing power consumption is disclosed. The sub-word line driving circuit includes a first transistor, a second transistor and a third transistor. The first transistor pre-charges a boost node to a first voltage in response to a main word line driving signal. The second transistor boosts the boost node to a second voltage in response to a sub-word line driving signal, and provides the sub-word line driving signal to a sub-word line. The third transistor provides the main word line driving signal to the sub-word line in response to a third voltage that has a lower level than a logic "high" state of the sub-word line driving signal.
申请公布号 US7545701(B2) 申请公布日期 2009.06.09
申请号 US20060634428 申请日期 2006.12.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 MIN YOUNG-SUN;CHOI JONG-HYUN
分类号 G11C8/00;G11C7/00 主分类号 G11C8/00
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