发明名称 Semiconductor devices having a trench in a side portion of a conducting line pattern and methods of forming the same
摘要 A semiconductor device having a trench in the side portion of a conducting line pattern and methods of forming the same. The semiconductor device provides a way of preventing an electrical short between the conducting line pattern and a landing pad adjacent to the conducting line pattern. There are disposed two conducting line patterns on a semiconductor substrate. Each of the conducting line patterns includes a conducting line and a conducting line capping layer pattern stacked thereon. Each of the conducting line patterns has a trench between the conducting line capping layer pattern and the conducting line. Conducting line spacers are formed between the conducting line patterns. One conducting line spacer covers a portion of a sidewall of one of the conducting line patterns, and the remaining conducting line spacer covers an entire sidewall of the remaining conducting line pattern. A landing pad is disposed between the conducting line patterns.
申请公布号 US7545046(B2) 申请公布日期 2009.06.09
申请号 US20050267176 申请日期 2005.11.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 NAM CHANG-HYEON;LEE SEUNG-KUN;CHOI JOONG-SUP;AHN CHANG-MOON;KANG WI-SEOB
分类号 H01L23/48;H01L23/52;H01L29/40 主分类号 H01L23/48
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