| 摘要 |
A probe device for testing a semiconductor is provided to improve yield of a semiconductor and to prevent misalignment by limiting a displacement possibility range of a probe needle within a range of a pad. A probe device for testing a semiconductor includes a probe needle(3), a printed circuit board(1), and a misalignment preventing plate(5). The probe needle is contacted in a pad of a wafer. The printed circuit board tests a pad(8) through the probe needle. The misalignment preventing plate is fixed to a bottom part of the printed circuit board by a supporting bar(6). The misalignment preventing plate includes a window(4) which exposes the probe needle to a bottom part. The misalignment preventing plate limits a displacement generation of the probe needle. |
