| 摘要 |
A probe card is provided to prevent a contact between probes by alternately positioning probe tips of a third probe group and a fourth probe group. A plurality of connection parts is arranged on a bottom surface of a substrate. A first probe group, a second probe group, a third probe group, and a fourth probe group(46a-46d) include base parts connected to the connection parts and main body parts extended from a bottom end of the base parts to a right and left direction. A probe tip part is extended from a front end of the main body part to a bottom side. The main body part of the probe of the first probe group and the third probe group is extended from a bottom end of the base part to a probe side of the second probe group and the fourth probe group. The main body part of the probe of the second probe group and the fourth probe group is extended from a bottom end of the base part to a probe side of the first probe group and the third probe group.
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