发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>A manufacturing method of a semiconductor device is provided to reduce a manufacturing time and cost of a semiconductor device by using an exposure technique using a gray tone photo mask or a half tone photo mask. A transparent conductive film and a first metal film are successively formed on a substrate. A common electrode(101) is arranged on an insulation substrate. A source interconnection(104) intersects with each gate interconnection(102) and a common interconnection(103). A pixel electrode(108) is arranged in a region which is surrounded by the gate interconnection, a common interconnection, and the source interconnection. An insulation film, a first semiconductor film, a second semiconductor film, and a second metal film are successively formed on the gate electrode. A protective film is formed on a thin film transistor. The pixel electrode is formed on the protective film.</p>
申请公布号 KR20090057909(A) 申请公布日期 2009.06.08
申请号 KR20080119871 申请日期 2008.11.28
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 FUJIKAWA SAISHI;CHIBA YOKO
分类号 H01L29/786 主分类号 H01L29/786
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