发明名称 TEST AND MEASUREMENT APPARATUS, AND METHOD OF CALIBRATING THE SAME
摘要 PROBLEM TO BE SOLVED: To calibrate setup time, hold time, and skew of a test and measurement apparatus 10. SOLUTION: Each input block 18 has a plurality of input circuits 16. Each input circuit 16 receives an input signal from a port 20, and receives a reference signal from a reference signal generator 12 in the test and measurement apparatus 10 directly and via a calibration port 24 and the port 20. The input circuits 16 can take the reference signal according to the reference signal. A channel for trigger by the reference signal also takes the reference signal, so that the characteristic of the channel can be measured and calibrated. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009122098(A) 申请公布日期 2009.06.04
申请号 JP20080275827 申请日期 2008.10.27
申请人 TEKTRONIX INC 发明人 ACUFF RONALD A;LARSON LESTER L;COSGROVE KEVIN E
分类号 G01R13/28;G01R35/00 主分类号 G01R13/28
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