| 摘要 |
PROBLEM TO BE SOLVED: To reduce an area of a narrow pitch part of a pattern wire and improve the freedom of routing in a contact probe. SOLUTION: The contact probe 10 has a plurality of pattern wires 12 stuck to a surface of a film body 11 and tips of at least part of the pattern wires serving as contact pins 13a. The pattern wires include a plurality of first wires 13 whose tips serve as the contact pins and a plurality of second wires 15 laminated on the first wires via an insulation layer 14. The second wires have connection parts connected with the middle of the first wires. COPYRIGHT: (C)2009,JPO&INPIT
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