发明名称 LAMINATED SEMICONDUCTOR PACKAGE WITH IMPROVED BONDING RELIABILITY
摘要 <P>PROBLEM TO BE SOLVED: To provide a laminated semiconductor package with an improved bonding reliability. <P>SOLUTION: The laminated semiconductor package includes a lower package 100a having a lower substrate 110 and a lower semiconductor chip 150 mounted on one surface of the lower substrate 110, an upper package 100b mounted on the lower package 100a and having an upper substrate 200 and at least one or more upper semiconductor chips 240, 250 mounted on one surface of the upper substrate 200, a joint member 310 arranged between the lower package 100a and the upper package 100b to electrically connect the lower package 100a and the upper package 100b, and a lower sealing member 320 arranged between the upper substrate 200 of the upper package 100b and the lower substrate 110 of the lower package 100a to actually surround the joint member 310 for protecting the lower semiconductor chip 150. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009124151(A) 申请公布日期 2009.06.04
申请号 JP20080291042 申请日期 2008.11.13
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 LEE TAE YOUNG;LEE DONG HA;LEE CHEOL-WOO
分类号 H01L25/065;H01L25/07;H01L25/18 主分类号 H01L25/065
代理机构 代理人
主权项
地址