| 摘要 |
<p>A method for detecting a mask defect of an end surface of a honeycomb structure comprises the steps of obtaining a first processing image by, while irradiating an end surface (6) of a honeycomb structure (1) which has undergone the step of sticking a transparent mask tape on the end surface (6) with a light beam (first irradiation light beam) (11) which forms an angle of 45° or more with a central axis (a) of the honeycomb structure (1), imaging the entire end surface (6) from the front side of the end surface (6), obtaining a second processing image by, while irradiating the end surface (6) with a light beam (second irradiation light beam) (12) which forms an angle of 5° or less with the central axis (a) of the honeycomb structure (1), imaging the entire end surface (6) from the front side of the end surface (6), and detecting a mask defect of the end surface (6) of the honeycomb structure (1) by calculating the ratio of the area of unsealed cells in a portion on which the mask tape is not stuck to the area of the entire end surface with the first processing image and the second processing image. The defect in the mask tape stuck on the end surface of the honeycomb structure can be efficiently detected by the method for detecting the mask defect of the end surface of the honeycomb structure.</p> |
