| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem wherein test terminals cannot be reduced fully. SOLUTION: The test circuit includes a plurality of circuit blocks each having the same circuit configuration and the same function; a plurality of test circuits each disposed so as to correspond to each of the plurality of circuit blocks; an OR circuit 11 for outputting an OR-operation result for test results TDOa-TDOc, which are output by the plurality of test circuits, as a first result signal X; an AND circuit 12 for outputting an AND-operation result of the test results TDOa-TDOc, which are output by the plurality of test circuits, as a second result signal Y; and a determining circuit 13 for outputting a matching comparison result of the first result signal X and the second result signal Y, as a final result signal Z. COPYRIGHT: (C)2009,JPO&INPIT
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