发明名称 MEMORY CELLS, ELECTRONIC SYSTEMS, METHODS OF FORMING MEMORY CELLS, AND METHODS OF PROGRAMMING MEMORY CELLS
摘要 Some embodiments include memory cells having vertically-stacked charge-trapping zones spaced from one another by dielectric material. The dielectric material may comprise high-k material. One or more of the charge-trapping zones may comprise metallic material. Such metallic material may be present as a plurality of discrete isolated islands, such as nanodots. Some embodiments include methods of forming memory cells in which two charge-trapping zones are formed over tunnel dielectric, with the zones being vertically displaced relative to one another, and with the zone closest to the tunnel dielectric having deeper traps than the other zone. Some embodiments include electronic systems comprising memory cells. Some embodiments include methods of programming memory cells having vertically-stacked charge-trapping zones.
申请公布号 WO2009051944(A3) 申请公布日期 2009.06.04
申请号 WO2008US77383 申请日期 2008.09.23
申请人 MICRON TECHNOLOGY, INC. 发明人 MIN, KYU, S.;BREWER, RHETT, T.;KRISHNAMOHAN, TEJAS;GRAETTINGER, THOMAS, M.;RAMASWANY, D., V., NIRMAL;WEIMER, RONALD, A.;BHATTACHARYYA, ARUP
分类号 H01L27/115 主分类号 H01L27/115
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