METHOD OF AND DEVICE FOR DETERMINING THE DISTANCE BETWEEN AN INTEGRATED CIRCUIT AND A SUBSTRATE

摘要

In a method of determining the distance(d) between an integrated circuit(1) and a substrate(2) a picture(31,32) of the integrated circuit(1) is taken. The integrated circuit(1) is attached to the substrate(2) that is at least semi transparent. An at least semi transparent material, particularly an at least semi transparent adhesive(8), is locatedbetween the integrated circuit(1) and the substrate(2). The picture(31,32) of the integrated circuit(1) is taken through the substrate(2) and the material(8). The picture(31,32) and/or image data related to the picture(31,32) is evaluated andthe distance(d) between the integrated circuit(1) and the substrate(2) is determined in response to the evaluated picture(31,32) and/or image data related to the picture(31,32).