发明名称 DESIGNING INTEGRATED CIRCUITS FOR YIELD
摘要 Method and system for designing integrated circuits for yield are described. Integrated circuits are designed for yield by finding worst yield corners based on design, statistical, and environmental variables and optimizing the design in light of the worst yield corners found.
申请公布号 US2009144671(A1) 申请公布日期 2009.06.04
申请号 US20070947737 申请日期 2007.11.29
申请人 CADENCE DESIGN SYSTEMS, INC. 发明人 LIU HONGZHOU;CLARK GLEN;NEUREUTER LORENZ;ZHANG HUI
分类号 G06F17/50 主分类号 G06F17/50
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