发明名称 System and Method for Improving Reliability of Integrated Circuit Packages
摘要 An integrated circuit package includes a die, a bump, an underbump metallization layer formed between the bump and the die, a portion of the underbump metallization layer under the bump having a first radius, and a redistribution layer formed between the underbump metallization layer and the die. The redistribution layer has a pad positioned under the underbump metallization layer. The pad has a second radius, and makes contact with the underbump metallization layer. The second radius is less than or equal to the first radius. The integrated circuit package also includes a first dielectric layer disposed between the die and the redistributing layer.
申请公布号 US2009140401(A1) 申请公布日期 2009.06.04
申请号 US20070948924 申请日期 2007.11.30
申请人 BEDDINGFIELD STANLEY CRAIG;TORRES ORLANDO FLORENDO;MCCARTHY ROBERT FABIAN 发明人 BEDDINGFIELD STANLEY CRAIG;TORRES ORLANDO FLORENDO;MCCARTHY ROBERT FABIAN
分类号 H01L23/495;H01L21/58 主分类号 H01L23/495
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