| 摘要 |
The invention comprises a method of functionalizing scanning probe microscope (SPM) tips to image and/or measure interactions between surfaces, including the surfaces of inorganic, organic-inorganic hybrid, organic, magnetic/conductive, hard coatings and biological materials. The invention further comprises the use of atomic layer deposition (ALD) to functionalize SPM tips. |
| 申请人 |
UNIVERSITETET I OSLO;NILSEN, OLA;FJELLVAG, HELMER;HAUGEN, HAVARD, J.;LYNGSTADAAS, STALE, PETTER;ELLINGSEN, JAN, EIRIK;LAMOLLE, SEBASTIEN, FRANCIS |
发明人 |
NILSEN, OLA;FJELLVAG, HELMER;HAUGEN, HAVARD, J.;LYNGSTADAAS, STALE, PETTER;ELLINGSEN, JAN, EIRIK;LAMOLLE, SEBASTIEN, FRANCIS |
