发明名称 Method and system for improving dielectric film quality for void free gap fill
摘要 A method of forming a silicon oxide layer on a substrate. The method includes providing a substrate and forming a first silicon oxide layer overlying at least a portion of the substrate, the first silicon oxide layer including residual water, hydroxyl groups, and carbon species. The method further includes exposing the first silicon oxide layer to a plurality of silicon-containing species to form a plurality of amorphous silicon components being partially intermixed with the first silicon oxide layer. Additionally, the method includes annealing the first silicon oxide layer partially intermixed with the plurality of amorphous silicon components in an oxidative environment to form a second silicon oxide layer on the substrate. At least a portion of amorphous silicon components are oxidized to become part of the second silicon oxide layer and unreacted residual hydroxyl groups and carbon species in the second silicon oxide layer are substantially removed.
申请公布号 US7541297(B2) 申请公布日期 2009.06.02
申请号 US20070876541 申请日期 2007.10.22
申请人 APPLIED MATERIALS, INC. 发明人 MALLICK ABHIJIT BASU;MUNRO JEFFREY C.;WANG LINLIN;NEMANI SRINIVAS D.;ZHENG YI;YUAN ZHENG;LUBOMIRSKY DIMITRY;YIEH ELLIE Y.
分类号 H01L21/469;H01L21/31 主分类号 H01L21/469
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