发明名称 |
APPARATUS AND METHOD FOR ATOMIC LAYER DEPOSITION |
摘要 |
An atomic layer deposition apparatus is provided to improve reactivity between the source gases, the deposition speed of a thin film, and the quality of the thin film by making source gas into plasma. An atomic layer deposition apparatus comprises: a process chamber performing thin film deposition by accepting a substrate; a susceptor supporting the substrate; a shower head providing source gas(S2) to the substrate; and a plasma generation part making one or more source gases into plasma and supplying the source gases inside the chamber. The plasma generation part comprises: a plasma chamber(151) accepting the source gas and providing a space which generates plasma(P); an electrode part(160,161,163) forming an electric field inside the plasma chamber; an insulation part(165) for insulation of the electrode part; and a power supply part(167) applying radio frequency power to the electrode part.
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申请公布号 |
KR20090055441(A) |
申请公布日期 |
2009.06.02 |
申请号 |
KR20070122367 |
申请日期 |
2007.11.28 |
申请人 |
K.C.TECH CO., LTD. |
发明人 |
SHIN, IN CHUL;JUN, YOUNG SU |
分类号 |
C23C16/455;C23C16/00;H01L21/20 |
主分类号 |
C23C16/455 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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