发明名称 APPARATUS AND METHOD FOR ATOMIC LAYER DEPOSITION
摘要 An atomic layer deposition apparatus is provided to improve reactivity between the source gases, the deposition speed of a thin film, and the quality of the thin film by making source gas into plasma. An atomic layer deposition apparatus comprises: a process chamber performing thin film deposition by accepting a substrate; a susceptor supporting the substrate; a shower head providing source gas(S2) to the substrate; and a plasma generation part making one or more source gases into plasma and supplying the source gases inside the chamber. The plasma generation part comprises: a plasma chamber(151) accepting the source gas and providing a space which generates plasma(P); an electrode part(160,161,163) forming an electric field inside the plasma chamber; an insulation part(165) for insulation of the electrode part; and a power supply part(167) applying radio frequency power to the electrode part.
申请公布号 KR20090055441(A) 申请公布日期 2009.06.02
申请号 KR20070122367 申请日期 2007.11.28
申请人 K.C.TECH CO., LTD. 发明人 SHIN, IN CHUL;JUN, YOUNG SU
分类号 C23C16/455;C23C16/00;H01L21/20 主分类号 C23C16/455
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