发明名称 Plasma processing method and plasma processing apparatus
摘要 A plasma processing method for performing a plasma process on a substrate to be processed by making a plasma act thereon includes the following sequential steps of making a plasma weaker than one used in the plasma process act on the substrate, applying a DC voltage to an electrostatic chuck for attracting and holding the substrate while the weak plasma acts on the substrate, extinguishing the weak plasma, and performing the plasma process. Further, a plasma processing apparatus includes a plasma processing mechanism for performing a plasma process on a substrate to be processed, and a controller for controlling the plasma processing mechanism to thereby perform the plasma processing method.
申请公布号 US7541283(B2) 申请公布日期 2009.06.02
申请号 US20050066260 申请日期 2005.02.28
申请人 TOKYO ELECTRON LIMITED 发明人 SHINDO TOSHIHIKO;OKAMOTO SHIN;HIGUCHI KIMIHIRO
分类号 H01L21/44;H01L21/00;H01L21/683 主分类号 H01L21/44
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