发明名称 Probe card transfer assist apparatus, and inspection equipment and method using same
摘要 A probe card transfer assist apparatus for assisting an operation of transferring a probe card used in an electrical inspection apparatus includes a holder for holding the probe card; a support for supporting the holder in a freely-rotate manner about a point; and an elevation unit for moving the support up and down. Further, an inspection equipment includes an electrical inspection apparatus; and a probe card transfer assist apparatus for assisting an operation of transferring a probe card used in the electrical inspection apparatus, the assist apparatus including a holder for holding the probe card; a support for supporting the holder in a freely-rotating manner about a point; and an elevation unit for moving the support up and down.
申请公布号 US7541801(B2) 申请公布日期 2009.06.02
申请号 US20060523710 申请日期 2006.09.20
申请人 TOKYO ELECTRON LIMITED 发明人 NAGASAKA MUNETOSHI;MOCHIZUKI CHIAKI
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
主权项
地址