发明名称 Methods of fabricating integrated circuit transistors by simultaneously removing a photoresist layer and a carbon-containing layer on different active areas
摘要 Integrated circuit transistors may be fabricated by simultaneously removing a photoresist layer on a first active area of an integrated circuit substrate and a carbon-containing layer on a second active area of the integrated circuit substrate, to expose a nitride stress-generating layer on the second active area. A single mask may be used to define the second active area for removal of the photoresist layer on the first active area and for implanting source/drain regions into the second active area.
申请公布号 US7541234(B2) 申请公布日期 2009.06.02
申请号 US20050266024 申请日期 2005.11.03
申请人 SAMSUNG ELECTRONICS CO., LTD.;CHARTERED SEMICONDUCTOR MANUFACTURING LTD.;INFINEON TECHNOLOGIES AG 发明人 CHANG CHONG KWANG;ZHUANG HAOREN;LIPINSKI MATTHIAS;MISHRA SHAILENDRA;KWON O SUNG;TJOA TJIN TJIN;KO YOUNG GUN
分类号 H01L21/8238 主分类号 H01L21/8238
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