| 摘要 |
An apparatus and a method for individual current setting for burn-in test are provided to prevent an overcurrent to each device by changing current supply value at each slot according to the number of a device. A current value setting unit(110) for DUT stores an allowable current for each DUT, and a DUT number setting unit(120) stores the number of DUT for burn-in board to be tested from a PC. A current setting unit(130) calculates a current supplied to each slot according to the number of DUT for the burn-in board stored in DUT number setting unit. The current setting unit calculates a current required for the burn-in board by multiplying the allowable current with the number of DUT. A current value controlling element(140) receives the current from the driver circuit. |
