| 摘要 |
PROBLEM TO BE SOLVED: To reduce test patterns used in testing a decoding processor. SOLUTION: The decoding processor includes: a decoding section for decoding compressed digital data stored in a compressed data memory section and generating decoded digital data; a serial output section for serially outputting the decoded digital data generated by the decoding section; and a comparing section for outputting a result obtained by comparing the decoded digital data generated by the decoding section with predestinate digital data to be obtained by decoding compressed digital data stored in a predestinate data memory section by using the decoding section. COPYRIGHT: (C)2009,JPO&INPIT |
