发明名称 S/N Ratio Measuring Method in Eddy Current Testing on Internal Surface of Pipe or Tube
摘要 A method in accordance with the present invention includes the steps of: separating an eddy current signal into an X-axis component and a Y-axis component to obtain signal waveform data of the respective components; excluding predetermined low-frequency components respectively from the respective signal waveform data thus obtained; calculating a noise voltage value V1 defined by the following Equation (1) based upon voltage values X(i) and Y(i) of the signal waveform data of the X-axis component and the Y-axis component from which the low-frequency components have been excluded; and calculating an S/N ratio by dividing a voltage value D of an eddy current signal corresponding to a predetermined artificial flaw by the noise voltage value V1: <maths id="MATH-US-00001" num="00001"> <math overflow="scroll"> <mtable> <mtr> <mtd> <mrow> <mrow> <mi>V</mi> <mo></mo> <mstyle> <mspace width="0.3em" height="0.3ex"/> </mstyle> <mo></mo> <mn>1</mn> </mrow> <mo>=</mo> <mrow> <mrow> <mi>pi</mi> <mo>/</mo> <mi>n</mi> </mrow> <mo>.</mo> <mrow> <munderover> <mo>∑</mo> <mrow> <mi>i</mi> <mo>=</mo> <mn>1</mn> </mrow> <mi>n</mi> </munderover> <mo></mo> <msup> <mrow> <mo>(</mo> <mrow> <msup> <mrow> <mi>X</mi> <mo></mo> <mrow> <mo>(</mo> <mi>i</mi> <mo>)</mo> </mrow> </mrow> <mn>2</mn> </msup> <mo>+</mo> <msup> <mrow> <mi>Y</mi> <mo></mo> <mrow> <mo>(</mo> <mi>i</mi> <mo>)</mo> </mrow> </mrow> <mn>2</mn> </msup> </mrow> <mo>)</mo> </mrow> <mrow> <mn>1</mn> <mo>/</mo> <mn>2</mn> </mrow> </msup> </mrow> </mrow> </mrow> </mtd> <mtd> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> </mtd> </mtr> </mtable> </math> </maths> where n represents the number of samplings of the signal waveform data.
申请公布号 US2009138222(A1) 申请公布日期 2009.05.28
申请号 US20060084380 申请日期 2006.10.27
申请人 KINOMURA SHOJI;NAKAO YOSHIYUKI;KODAI TOSHIYA;NISHIYAMA SHUGO 发明人 KINOMURA SHOJI;NAKAO YOSHIYUKI;KODAI TOSHIYA;NISHIYAMA SHUGO
分类号 G01R29/26;G01R23/16 主分类号 G01R29/26
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