发明名称 |
SEMICONDUCTOR SUBSTRATE MANUFACTURING METHOD USING SOQ SUBSTRATE, AND SEMICONDUCTOR SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor substrate manufacturing method for forming a semiconductor substrate to reduce thermal stress which is produced by a difference in thermal expansion coefficients between a supporting substrate (silica) and a silicon nitride film formed on the silicon film, and to provide the semiconductor substrate which is manufactured in this method. SOLUTION: The semiconductor substrate manufacturing method uses a SOQ substrate for forming a semiconductor element part on the SOQ substrate and an insulating film different in thermal expansion coefficient from silica around the semiconductor element part. Herein, a separating member for the insulating film is provided around the semiconductor element part. COPYRIGHT: (C)2009,JPO&INPIT
|
申请公布号 |
JP2009117460(A) |
申请公布日期 |
2009.05.28 |
申请号 |
JP20070286101 |
申请日期 |
2007.11.02 |
申请人 |
CITIZEN FINETECH MIYOTA CO LTD |
发明人 |
SEKIGUCHI KANETAKA |
分类号 |
H01L21/02;H01L21/76;H01L21/764;H01L27/12 |
主分类号 |
H01L21/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|