发明名称 SEMICONDUCTOR SUBSTRATE MANUFACTURING METHOD USING SOQ SUBSTRATE, AND SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor substrate manufacturing method for forming a semiconductor substrate to reduce thermal stress which is produced by a difference in thermal expansion coefficients between a supporting substrate (silica) and a silicon nitride film formed on the silicon film, and to provide the semiconductor substrate which is manufactured in this method. SOLUTION: The semiconductor substrate manufacturing method uses a SOQ substrate for forming a semiconductor element part on the SOQ substrate and an insulating film different in thermal expansion coefficient from silica around the semiconductor element part. Herein, a separating member for the insulating film is provided around the semiconductor element part. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009117460(A) 申请公布日期 2009.05.28
申请号 JP20070286101 申请日期 2007.11.02
申请人 CITIZEN FINETECH MIYOTA CO LTD 发明人 SEKIGUCHI KANETAKA
分类号 H01L21/02;H01L21/76;H01L21/764;H01L27/12 主分类号 H01L21/02
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