发明名称 MODIFIED MICHELSON DELAY LINE INTERFEROMETER
摘要 In an optical etalon with a fixed FSR determined by the cavity length, the time delay is adjusted by an etalon surface coating. The proper cavity length is chosen to achieve a desired FSR, and the coating is independently selected to obtain a desired time delay.
申请公布号 US2009135473(A1) 申请公布日期 2009.05.28
申请号 US20080174628 申请日期 2008.07.16
申请人 发明人 HSIEH YUNG-CHIEH
分类号 G02F2/00;G01B9/02 主分类号 G02F2/00
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