发明名称 PHOTORESIST COMPOSITIONS AND PROCESS FOR MULTIPLE EXPOSURES WITH MULTIPLE LAYER PHOTORESIST SYSTEMS
摘要 <p>A photoresist composition and methods using the photoresist composition in multiple exposure/multiple layer processes. The photoresist composition includes a polymer comprising repeat units having a hydroxyl moiety; a photoacid generator; and a solvent. The polymer when formed on a substrate is substantially insoluble to the solvent after heating to a temperature of about 150 °C or greater. One method includes forming a first photoresist layer (120) on a substrate (110), patternwise exposing the first photoresist layer, forming a second non-photoresist layer on the substrate and patterned first photoresist layer (120A). Another method includes forming a first photoresist layer (120) on a substrate (110), patternwise exposing the first photoresist layer, forming a second photoresist layer (130) on the substrate and patterned first photoresist layer (120A) and patternwise exposing the second photoresist layer.</p>
申请公布号 WO2009067354(A1) 申请公布日期 2009.05.28
申请号 WO2008US83092 申请日期 2008.11.11
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;HUANG, WU-SONG;CHEN, KUANG-JUNG;VARANASI, PUSHKARA, RAO;LI, WAI-KIN 发明人 HUANG, WU-SONG;CHEN, KUANG-JUNG;VARANASI, PUSHKARA, RAO;LI, WAI-KIN
分类号 H01L21/00 主分类号 H01L21/00
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