发明名称 VARIABLE CAPACITANCE MEASURING APPARATUS AND VARIABLE CAPACITANCE MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a variable capacitance measuring apparatus which is easily integrated, extremely low in power consumption, and suitable for downsizing. SOLUTION: An SAR-type A/D converter is utilized, and an electric charge is measured in place of a voltage. The operation of charging at an initial stage differs from that of the SAR-type A/D converter, and only a capacitive pressure sensor is charged. A capacitance offset canceling circuit is disposed in order to properly detect a change in capacitance. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009115710(A) 申请公布日期 2009.05.28
申请号 JP20070291068 申请日期 2007.11.08
申请人 TOKYO INSTITUTE OF TECHNOLOGY 发明人 MATSUZAWA AKIRA;TANAKA KYOTA
分类号 G01L9/12 主分类号 G01L9/12
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