| 摘要 |
PROBLEM TO BE SOLVED: To effectively generate enhanced electric field in an analyzer for placing a material to be analyzed on the surface of an optical resonator for generating the enhanced electric field on the surface, into which a light of a particular wavelength is incident on, utilizing the enhanced electric field generated on the surface of the optical resonator, and analyzing the characteristics of the material. SOLUTION: The analyzer includes: the optical resonator for internally resonating the light beam, having a predetermined wavelength and making the light beam enter from the surface into the interior, and for generating the enhanced electric field on the surface; a wavelength-variable laser light source for irradiating the light beam incident on the surface of the optical resonator, and continuously making the wavelength of the irradiated light beam change; and a wavelength setting means for making the wavelength of the light beam change, determining the resonance wavelength of the optical resonator having the maximum strength for the enhanced electric field, and setting the wavelength of the light beam irradiated from the wavelength-variable laser light source, to the determined resonance wavelength. COPYRIGHT: (C)2009,JPO&INPIT
|
