| 摘要 |
The invention relates to a microelectronic sensor device for optical examinations like the detection of target components that comprise label particles(1), for example magnetic particles(1). An input light beam(L1) is transmitted into a carrier(111) and totally internally reflected at a binding surface(112) to yield a "TIR- beam of first order" (LTIR(1) ), which is redirected by a mirroring system (e.g. reflective 5 facets(114)) to the binding surface(112), where it is againtotally internally reflected as a "TIR-beam of second order" (LTIR(2) ), and so on. Finally, an output light beam(L2) comprising lightofthe "TIR-beam of (N+1)-thorder", witha given natural number N, leaves the carrier to be detected by a lightdetector(31). |
