SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND ITS TEST METHOD

摘要

When the operation frequency of a tester or an input/output circuit of a semiconductor integrated circuit device is lower than the frequency of a test input signal, an amount of disturbance allowance of a circuit under test can be measured without stopping the operation of the circuit under test included in the semiconductor integrated circuit device. The semiconductor integrated circuit device has a normal output signal counter for counting, when the circuit under test repeats, a plurality of times in sequence, a process for each input signal of an input signal group including one or two or more input signals, the number of how many times the circuit under test has outputted a normal output signal in response to a predetermined input signal among the input signal group.