Verfahren zur Beurteilung einer Halbleiterschaltung,申请号DE200711001969T-传众专利搜索

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发明名称	Verfahren zur Beurteilung einer Halbleiterschaltung
摘要
申请公布号	DE112007001969(A5)	申请公布日期	2009.05.28
申请号	DE200711001969T	申请日期	2007.06.21
申请人	CONTI TEMIC MICROELECTRONIC GMBH	发明人	JOOS, ULI;SCHNELL, JOSEF;AXMANN, STEFAN;LAENGLE, KLAUS
分类号	H03K17/18;G01R31/26;G06F11/00	主分类号	H03K17/18
代理机构		代理人
主权项
地址

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