发明名称 TEST APPARATUS AND MEASUREMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To accurately measure current consumption of a device under test. SOLUTION: This test apparatus for testing a device under test includes a voltage supplying section which supplies a voltage to the device under test through a wire, a first capacitor which is arranged between the wire and a common potential in series, a current detecting section which detects a current flowing through the wire at a location closer to the device under test than the first capacitor is, an integrating section which outputs an integration value obtained by integrating a difference between the current detected by the current detecting section and a predetermined reference current, and a determining section which determines whether the device under test is a pass or a failure based on the integration value. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009115794(A) 申请公布日期 2009.05.28
申请号 JP20080278849 申请日期 2008.10.29
申请人 ADVANTEST CORP 发明人 HASHIMOTO YOSHIHIRO
分类号 G01R31/26 主分类号 G01R31/26
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