发明名称 POLISHING SLURRY, METHOD OF PRODUCING SAME, AND METHOD OF POLISHING SUBSTRATE
摘要 Disclosed is a polishing slurry, particularly, a slurry for chemical mechanical polishing, which is used in a chemical mechanical polishing process for flattening a semiconductor laminate. More particularly, the present invention provides a method of producing a slurry which has high removal selectivity to a nitride layer used as a barrier film in a shallow trench isolation CMP process needed to fabricate ultra highly integrated semiconductors of 256 mega D-RAM or more (Design rule of 0.13 mum or less) and which decreases the occurrence of scratches on a flattened surface, and a method of polishing a substrate using the same.
申请公布号 US2009133336(A1) 申请公布日期 2009.05.28
申请号 US20080333170 申请日期 2008.12.11
申请人 K.C. TECH CO., LTD.;IUCF-HYU 发明人 KIM DAE HYEONG;HONG SEOK MIN;JEON JAE HYUN;PAIK UN GYU;PARK JEA GUN;KIM YONG KUK
分类号 C09G1/02;C09K3/14 主分类号 C09G1/02
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