| 摘要 |
<P>PROBLEM TO BE SOLVED: To reduce the number of terminals, and also prevent malfunctions. <P>SOLUTION: The semiconductor integrated circuit 1 includes a boundary scan function. The semiconductor integrated circuit 1 has TAP controllers 2a, 2b, a signal input reception section 3, and a selection signal generation section 4. The signal input reception section 3 receives a TDI signal provided with a test signal to be supplied to the TAP controllers 2a, 2b and a TRST signal for initializing the TAP controllers 2a, 2b. The selection signal generation section 4 generates a selection signal for determining functions of the semiconductor integrated circuit 1 in accordance with the TDI signal when the TAP controllers 2a, 2b are initialized by the TRST signal. <P>COPYRIGHT: (C)2009,JPO&INPIT |
