发明名称 LED INSPECTION APPARATUS AND LED INSPECTION METHOD USING THE SAME
摘要 Disclosed are a light emitting diode (LED) inspection apparatus, which can determine whether an LED has a defect such as leakage current, without making physical contact with the LED being inspected, and an LED inspection method thereof. The LED inspection apparatus includes an ultraviolet emission unit emitting UV light to an LED, an image generation unit generating an image of the LED to which the UV light is emitted, and a control unit obtaining color or intensity information of the LED from the image of the LED and determining, based on the color information, whether the LED is defective
申请公布号 US2009136120(A1) 申请公布日期 2009.05.28
申请号 US20080275581 申请日期 2008.11.21
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 ONUSHKIN GRIGORY;SON JOONG KON;LIM JONG HOON;HONG SANG SU
分类号 G06K9/00;G01J3/50;G01M11/00;G01N21/63;H01L33/00 主分类号 G06K9/00
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