Method for testing a working memory

摘要

The method involves testing a portion of addressing unit for address errors, and testing a portion of memory cells (3) for cell errors, where the testing steps take place temporally independent of one another. Stuck-at-address errors and coupling-address errors are determined. An address bit of n-bits of an address bus (5) is set from 0 to 1 and from 1 to 0 under retention of state of remaining address bits for determining the stuck-at-address errors. Different bit patterns are written in the memory cells based on setting of the address bits.