| 摘要 |
FIELD: physics. ^ SUBSTANCE: invention relates to atomic emission spectral analysis. The method includes sample introduction into aflame of plasma, registration of the sequence of atomic emission spectrum during the flow of the sample into the plasma, calculation of the intensity of the analytical spectral line of the desired element depending on the arrival time of the sample into the flame of the plasma, determining by the calibration dependence of concentration of the desired element in the sample, and determining the distribution of particles of the sample by mass. The concentration of all the desired elements is determined simultaneously due to the fact that each spectrum sequence is recorded in the spectral range, including the analytical spectral line of the desired elements. Calculation of the intensity of the analytical spectral lines in carried out in each spectrum taking into account the background under the line, after this the dependence concentration of the desired element is obtained from the arrival time of the sample into the plasma, and as per the indicated dependencies the mass of the particles and the concentration of the desired elements in the particles are determined. ^ EFFECT: providing simultaneous determination of the distribution of particles by mass in a dispersed sample. ^ 6 cl, 4 dwg, 2 tbl |
