发明名称 |
Strain-independent microstructure characterisation |
摘要 |
<p>The method involves charging a material with two load voltages of different values. A magnetic field is applied on the material, and a measured variable e.g. magnetic flux density, based on magnetic field strength of the magnetic field is received for each load voltage. A characteristic magnetic field strength is determined. The measured variable, or variables derived from the measured variable and corresponding to the load voltages have the same value. A micro-structure of the material is characterized by the characteristic magnetic field strength and/or the value. Independent claims are also included for the following: (1) a method for comparing micro-structures of two materials (2) a device for characterization of a micro-structure of a material (3) a device for comparing micro-structures of two materials.</p> |
申请公布号 |
EP2063266(A1) |
申请公布日期 |
2009.05.27 |
申请号 |
EP20070022420 |
申请日期 |
2007.11.19 |
申请人 |
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. |
发明人 |
ALTPETER, IRIS, DR.-ING.;SZIELASKO, KLAUS, DIPL.-ING. (FH) |
分类号 |
G01N27/72;G01N27/82 |
主分类号 |
G01N27/72 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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