发明名称 Strain-independent microstructure characterisation
摘要 <p>The method involves charging a material with two load voltages of different values. A magnetic field is applied on the material, and a measured variable e.g. magnetic flux density, based on magnetic field strength of the magnetic field is received for each load voltage. A characteristic magnetic field strength is determined. The measured variable, or variables derived from the measured variable and corresponding to the load voltages have the same value. A micro-structure of the material is characterized by the characteristic magnetic field strength and/or the value. Independent claims are also included for the following: (1) a method for comparing micro-structures of two materials (2) a device for characterization of a micro-structure of a material (3) a device for comparing micro-structures of two materials.</p>
申请公布号 EP2063266(A1) 申请公布日期 2009.05.27
申请号 EP20070022420 申请日期 2007.11.19
申请人 FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. 发明人 ALTPETER, IRIS, DR.-ING.;SZIELASKO, KLAUS, DIPL.-ING. (FH)
分类号 G01N27/72;G01N27/82 主分类号 G01N27/72
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