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发明名称
DEFECT REDUCTION USING ASPECT RATIO TRAPPING
摘要
Lattice-mismatched epitaxial films formed proximate non-crystalline sidewalls. Embodiments of the invention include formation of facets that direct dislocations in the films to the sidewalls.
申请公布号
EP2062290(A1)
申请公布日期
2009.05.27
申请号
EP20070837902
申请日期
2007.09.07
申请人
AMBERWAVE SYSTEMS CORPORATION
发明人
BAI, JIE;PARK, JI-SOO;LOCHTEFELD, ANTHONY, J.
分类号
H01L21/20
主分类号
H01L21/20
代理机构
代理人
主权项
地址
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