发明名称 DEFECT REDUCTION USING ASPECT RATIO TRAPPING
摘要 Lattice-mismatched epitaxial films formed proximate non-crystalline sidewalls. Embodiments of the invention include formation of facets that direct dislocations in the films to the sidewalls.
申请公布号 EP2062290(A1) 申请公布日期 2009.05.27
申请号 EP20070837902 申请日期 2007.09.07
申请人 AMBERWAVE SYSTEMS CORPORATION 发明人 BAI, JIE;PARK, JI-SOO;LOCHTEFELD, ANTHONY, J.
分类号 H01L21/20 主分类号 H01L21/20
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