发明名称 System for integrated data integrity verification and method thereof
摘要 In accordance with one technique, a first plurality of values associated with data transfers between a processor and a memory is received at the processor and at least a subset of the first plurality of values are accumulated in one or more accumulators. The one or more accumulators are accessed to obtain a first accumulated value and the first accumulated value is compared with a first expected accumulated value. In accordance with a second technique, a first plurality of load operations are performed at a processor to access data values stored in a first sequence of fields of a memory. The data values are accumulated in one or more accumulators of the processor to generate a first accumulated value and it is determined whether the memory has been corrupted based on a comparison of the first accumulated value to a first expected accumulation value.
申请公布号 US7539906(B2) 申请公布日期 2009.05.26
申请号 US20050094593 申请日期 2005.03.30
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 MOYER WILLIAM C.
分类号 G06F11/00 主分类号 G06F11/00
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