METHOD FOR EXAMINING A SAMPLE

摘要

The invention relates to a method for examining a sample using a scanning tunneling microscope, characterised in that in at least one location on the tip of the scanning tunneling microscope and/or on the sample, which is part of the tunneling contact on taking an image, a contrast agent is applied before or during the image taking, whilst the temperature at said location is adjusted to be at or below the condensation temperature of the contrast agent. A corresponding scanning tunneling microscope is also disclosed.