| 发明名称 |
IMPROVED ELECTRONIC COMPONENT HANDLER TEST PLATE |
| 摘要 |
<p>An improved electronic component handler and associated improved test plate are described. A guide on the test plate is used to intersect the testing apertures to eliminate misalignment of the component loading frame and the aperture to ensure easy insertion of components into the test apertures.</p> |
| 申请公布号 |
WO2009064820(A2) |
申请公布日期 |
2009.05.22 |
| 申请号 |
WO2008US83291 |
申请日期 |
2008.11.13 |
| 申请人 |
ELECTRO SCIENTIFIC INDUSTRIES, INC.;BOE, GERALD, F. |
发明人 |
BOE, GERALD, F. |
| 分类号 |
H01G13/00;G01R31/26;B07C5/344 |
主分类号 |
H01G13/00 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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