发明名称 ANTI-FUSE CIRCUIT AND SEMICONDUCTOR DEVICE HAVING THE SAME, AND METHOD FOR WRITING ADDRESS TO ANTI-FUSE CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide an anti-fuse circuit capable of disabling a fuse set concerned even if writing to a defective address fails. SOLUTION: The anti-fuse circuit has a plurality of fuse sets 100 including an anti-fuse element 330 for holding data in a nonvolatile manner. The fuse sets include: a plurality of bit storage circuits 210 for storing a defective address; and a disable circuit 230 for disabling the defective address stored in the plurality of bit storage circuits. Since each fuse set 100 has the disable circuit 230, the fuse set to which a defective address has been written once can be disabled after that. Therefore, even if writing a defective address fails, it is not necessary to abolish an entire chip. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009110584(A) 申请公布日期 2009.05.21
申请号 JP20070280822 申请日期 2007.10.29
申请人 ELPIDA MEMORY INC 发明人 MIYATAKE SHINICHI;OGAWA SUMIO
分类号 G11C29/04 主分类号 G11C29/04
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