发明名称 WAVEFORM DISPLAY METHOD AND TEST MEASUREMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an oscilloscope having automatic range and automatic setting functions to vertically display a plurality of waveforms in order to strengthen trigger, measurement, and secondary functions. SOLUTION: An overlap option is selected and the vertical height of each of the waveforms is specified to the selected overlap option. Each waveform grounding marker is adjusted according to the specified vertical height and the selected overlap option. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009109491(A) 申请公布日期 2009.05.21
申请号 JP20080265652 申请日期 2008.10.14
申请人 TEKTRONIX INC 发明人 NELSON CRAIG H;SHANKS DAVID;DICKINSON EVAN A;RUNNING LEIF X;HERRING STEVEN C
分类号 G01R13/20;G01R13/30 主分类号 G01R13/20
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