发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR SUBSTRATE WITH PENETRATING ELECTRODE, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE WITH PENETRATING ELECTRODE |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor substrate with a penetrating electrode capable of efficiently forming a penetrating electrode on the semiconductor substrate having a device and wiring already formed thereon; and a manufacturing method of a semiconductor device with a penetrating electrode. SOLUTION: In the manufacturing method of a semiconductor substrate with a penetrating electrode, first silicon oxide films 12 are formed on principal surfaces of a semiconductor substrate 11; a pore 13 reaching the first silicon oxide film 12 on one-side principal surface side from the principal surface A is formed; a second silicon oxide film 14 is formed on a hole wall of the pore 13; a first metal thin film 15 and a second metal thin film 16 are formed on the first silicon oxide film 12; the first silicon oxide film 12 at an end of the pore 13 is removed; and the penetrating electrode 17 is formed by filling a conductive substance in the pore 13. The pore 13 is formed by a DRIE method. The conductive substance is filled in the pore 13 by a molten metal suction method or a print method. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009111433(A) |
申请公布日期 |
2009.05.21 |
申请号 |
JP20090035840 |
申请日期 |
2009.02.18 |
申请人 |
FUJIKURA LTD;OLYMPUS CORP |
发明人 |
YAMAMOTO SATOSHI;TAKIZAWA ISAO;SUEMASU TATSUO;KATASHIRO MASAHIRO;MIYAJIMA HIROSHI;MATSUMOTO KAZUYA;ISOKAWA TOSHIHIKO |
分类号 |
H01L21/3205;H01L23/12;H01L23/14;H01L23/52 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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