发明名称 AUTOMATED TEST AND CHARACTERIZATION DATA ANALYSIS METHODS AND ARRANGEMENT
摘要 A method for testing a component configured to be installed in a plasma processing system. The method includes providing an ATAC (Automated Test and Characterization) fixture, which includes a system control software package ( SCS) that is representative of production system control software, a data manager module configured to obtain specification data from a database over a computer network, a test manager module configured to execute a set of tests designed to test the component, a SCS interface engine configured to provide the set of tests to the SCS, and a data analysis module configured to provide computer-implemented data analysis tool for analyzing test data obtained from the testing the component. The method also includes coupling the ATAC fixture to the component to enable the SCS in the ATAC fixture to test the component utilizing the set of tests and at least a portion of the specification data.
申请公布号 KR20090051184(A) 申请公布日期 2009.05.21
申请号 KR20097004073 申请日期 2007.08.03
申请人 LAM RESEARCH CORPORATION 发明人 KU TINA PAI LIU;BALLINTINE PAUL RONALD;HSU GEAN;SARMIENTO JAIME
分类号 G06F11/00;G06F15/16;G06F17/18 主分类号 G06F11/00
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